Yttrium Oxide
Report on Y2O3 Coating
Y2O3 coating on inner surface of quartz tube OD=25.4mm, ID=22mm.
The coating was examined by the following methods:
- Surface morphology by HRSEM (High Resolution)
- EDS analysis on the inner surface (Carbon coating for the analysis)
- Metallographic cross-section (SEM Philips XL-30)
The results were as follows:
The surface morphology is shown in Figs 1, 2 and reveals dense coating of nano-sized crystals (~30nm). No pin-holes were revealed.
EDS (LINK ISIS) spectrum obtained in the middle of the tube is shown in Fig 3 and reveals 88wt% Y2O3+ 12wt% SiO2 (substrate). Since the depth of EDS analysis is ~ 1µm, there is the indication that Y2O3 layer thickness is close to 1µm.
Metallographic cross-section prepared at the end of the tube reveals dense, uniform coating of ~0.5µm - see arrows in Figs 4 and 5. No discontinuities or other defects were revealed at the quartz/Y2O3 layer interface. In the central part of the tube a coating thickness of ~0.75µm was observed, see Fig 6.